| |
FOCUS
TOPICS
|
LED driver; step-down converter
DDR1-3 DRAM |
|
0.35um BCDMOS (SOI)
90-70nm CMOS |
AREAS
OF RESPONSIBILITY
|
product owner
for development and optimization
(to date 6 product families; during validation, qualification, ramp-up and
sustaining project phase)
proven
project management skills – technology-lead product development during
high volume production
responsibility
to plan, structure and execute product engineering work packages, including
prioritization across projects
in charge of
achieving project targets and timelines, as well as key performance
indicator objectives (esp. quality level) |
|
proven
leadership experience - direction of an international team of engineers
(up to 6 members)
training of new
employees; world-wide transfer of knowledge |
|
primary
interface to program and quality management (consulting, reporting role)
main contact
person for international production sites, design centres and assembly/reliability
subcontractors (US, Asia, Europe) |
|
optimization of
the product development business process, revision of the product
qualification guidelines, ISO 9001 audits (in each case consulting,
supporting function) |
Fields
of Activities
|
package selection; assembly
document preparation and release (package outline, bill of material, bond
diagram, marking); control of engineering builds |
|
functional design analysis (component,
wafer); parametric bench characterization (datasheet);
corner behaviour investigation (voltage, temperature, process); development
of measurement hard/software and evaluation tools; electrical failure
analysis (pico probing, FIB modification); validation result reports |
|
test content definition (FE, BI
and BE automated test equipment); implementation and debugging support (hardware,
code); determination of screen limits and guard bands; accurate correlation
to datasheet; test flows for production; test time reduction; design for
test |
|
qualification (product, package)
according to Jedec JESD47 and AEC Q100; definition of requirements for
product stress test; development of HTOL and HAST hardware; electrical and
physical failure analysis of qualification fails; implementation of
corrective actions; documentation of qualification progress and final report
|
|
root-cause analysis of customer
returns and internal monitoring fails; definition of containment and
corrective actions on all levels; business process and learning loop
improvements; 8D-reporting to customer |
|
optimization of yield, test time
and quality; periodic statistical investigations (cpk, dpm); handover of
released product to supply chain for mass production |
TRAININGS
|
Advantest:
Memory Test Systems - Applications I+II
Enteq:
IMS/Orion Memory Tester – Basic and Advanced Training Course
Prof.
Hoffmann:
Design of Analog and Digital CMOS Circuits
Dr. Maichen:
High-Speed Digital Test Techniques
Telefunken:
Production Control Plan and Fundamental Parameters |
|
Resultance:
Project Contributor Training – Basic Project Management Course
Telefunken:
Failure Mode and Effect Analysis |
|
Ruth
Schaefer:
Cross Cultural Training - China/Taiwan |
|
Global
Competence Forum:
Product Risk and Reliability - Worldwide |
|